发明名称 |
CHOKE DETECTING CIRCUIT FOR RADIATION MEASURING INSTRUMENT USING SEMICONDUCTOR DETECTOR |
摘要 |
PURPOSE:To permit detection of a chock condition of a measuring system by detecting the voltage drop of a load resistor connected to a bias power supply for supplying bias current to a semiconductor detector which generates pulses by detecting radiations and comparing the same with a chock detection value. CONSTITUTION:The load resistor 5 is connected to the power supply side of the bias power supplying 1 for supplying the bias current to the silicon semiconductor detector 2 and the current flowing in order to replenish the electric charge generated by the generator 2 is detected by an amplifier circuit 7 for amplifying the voltage drop across the resistor 5 and is converted by an LPF 8 to a DC voltage. This converted voltage is compared by a comparator 10. The output of the comparator 10 inverts and the choke detection signal is outputted from an output circuit 11 when the converted voltage attains the set value by a choke detection setter 9 or above. The choke condition of the measuring system which arises under high radiation is thereby detected and the erroneous measurement occurring in the choke is prevented.
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申请公布号 |
JPS63236988(A) |
申请公布日期 |
1988.10.03 |
申请号 |
JP19870070696 |
申请日期 |
1987.03.25 |
申请人 |
HITACHI LTD;HITACHI ENG CO LTD |
发明人 |
KAIHARA AKIHISA;MORITA YUJI |
分类号 |
G01T1/24;G01T1/17;H01L31/00;H01L31/09 |
主分类号 |
G01T1/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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