发明名称 CHOKE DETECTING CIRCUIT FOR RADIATION MEASURING INSTRUMENT USING SEMICONDUCTOR DETECTOR
摘要 PURPOSE:To permit detection of a chock condition of a measuring system by detecting the voltage drop of a load resistor connected to a bias power supply for supplying bias current to a semiconductor detector which generates pulses by detecting radiations and comparing the same with a chock detection value. CONSTITUTION:The load resistor 5 is connected to the power supply side of the bias power supplying 1 for supplying the bias current to the silicon semiconductor detector 2 and the current flowing in order to replenish the electric charge generated by the generator 2 is detected by an amplifier circuit 7 for amplifying the voltage drop across the resistor 5 and is converted by an LPF 8 to a DC voltage. This converted voltage is compared by a comparator 10. The output of the comparator 10 inverts and the choke detection signal is outputted from an output circuit 11 when the converted voltage attains the set value by a choke detection setter 9 or above. The choke condition of the measuring system which arises under high radiation is thereby detected and the erroneous measurement occurring in the choke is prevented.
申请公布号 JPS63236988(A) 申请公布日期 1988.10.03
申请号 JP19870070696 申请日期 1987.03.25
申请人 HITACHI LTD;HITACHI ENG CO LTD 发明人 KAIHARA AKIHISA;MORITA YUJI
分类号 G01T1/24;G01T1/17;H01L31/00;H01L31/09 主分类号 G01T1/24
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