| 摘要 |
PURPOSE:To detect contact or short-circuit in a short time by applying pulse signals between external terminals of a semiconductor device through a serial resistance and comparing the number of pulse signals from the connection point between the serial resistance and external terminal with the number of pulse signals from a pulse signal generation part. CONSTITUTION:Heat is generated with an electric current generated with a pulse signal P1 applied between the external terminals T1 and T2, there is unnecessary contact or separation caused or the contact held if there is the unnecessary contact or short-circuit between electrode wires in the semiconductor device, a semiconductor chip and an electrode wire, the external terminals, an external terminal and an electrode wire, the external terminals, an external terminal and an electrode wire, etc. In this case, a pulse signal P1 which is invariably at a high level is inputted unless there is the contact or short circuit and the output terminal of a gate circuit G is held at a low level at all times, so that a dissidence signal P3 is not outputted. If, however, there is the contact or short circuit, the high-level dissidence signal P3 is outputted which indicates that the pulse signals P1 and P2 is difference in number.
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