| 摘要 |
PURPOSE:To analyze polarized light with high accuracy by finding the complex amplitude reflection factor ratio of an S wave and a P wave of a sample from both beat waves generated by making the S wave and P wave of incident light and the S wave and P wave of reflected light cause heterodyne interference. CONSTITUTION:Laser light from a laser 1 is made incident on an orthogonal two- frequency AO modulator 3 and converted into two-frequency orthogonal linear polarized light which has a constant frequency difference, and the light is made incident on the sample 5. Then, part of the incident light is reflected by a half-mirror 6 and made incident on a 1st photoelectric converter 9 through a 1st analyzer 7, and reflected light from the sample 5 is made incident on a 2nd photoelectric converter 12 through a 2nd analyzer 10. Consequently, the beat wave by the heterodyne interference between the P wave and S wave of the incident light to the sample 5 and the beat wave by the heterodyne interference between the P wave and S wave of the reflected light from the sample 5 are generated and signals corresponding to the beat signals are outputted from the converters 9 and 12. Then, a phase meter 18 calculates the phase difference between the beat waves and a computer 19 calculates the complex amplitude reflection factor ratio. |
