发明名称 PSEUDO CALL TESTING DEVICE
摘要 PURPOSE:To remarkably reduce the setting numbers of transmission-reception circuits by inserting a time division switching circuit consisting of semiconductor circuit element between the transmission-reception circuit of a testing signal and the respective line terminals of an exchange. CONSTITUTION:The connection state between the respective signal terminals PO-PN on one side and the respective signal terminals QO-QM on another side in the time division switching circuit 27 is decided with a connection control signal transmitted from a control circuit 21 such as a microcomputer, etc. Therefore, the microcomputer, etc., can optionally control what line terminal of the exchange 23 the testing signal outputted from a signal generation circuit 33 is transmitted to or the answer signal outputted from what line terminal of the exchange is inputted in a signal reception circuit. As a result, plural kinds of connection speech paths can be simultaneously formed in the exchange and a testing efficiency can be improved.
申请公布号 JPS63232555(A) 申请公布日期 1988.09.28
申请号 JP19870065178 申请日期 1987.03.19
申请人 ANRITSU CORP 发明人 KOBAYASHI SHIGEMI;MATSUMOTO ISAO
分类号 H04M3/26 主分类号 H04M3/26
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