发明名称 |
Dynamic random access memory device having a plurality of improved one-transistor type memory cells. |
摘要 |
<p>A dynamic random access memory device including one-transistor type memory cells each having a trench capacitor is disclosed. An impurity region of a conductivity type opposite to the substrate and having a net-like plane shape is provided in an inner portion of the substrate, and the impurity region is led-out at a part to the major surface of the substrate. A trench is formed in the substrate from the major surface into the impurity region so that a wall section of the trench is constituted by the impurity region. An dielectric film of the capacitor is formed on the wall section, and a capacitor electrode is formed on the dielectric film and connected to source or drain region of the transistor.</p> |
申请公布号 |
EP0283964(A2) |
申请公布日期 |
1988.09.28 |
申请号 |
EP19880104391 |
申请日期 |
1988.03.18 |
申请人 |
NEC CORPORATION |
发明人 |
NISHIMOTO, SHOZO;INOUE, YASUKAZU;KOTAKI, HIROSHI |
分类号 |
H01L21/8242;H01L27/108;H01L29/94 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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