发明名称 Dynamic random access memory device having a plurality of improved one-transistor type memory cells.
摘要 <p>A dynamic random access memory device including one-transistor type memory cells each having a trench capacitor is disclosed. An impurity region of a conductivity type opposite to the substrate and having a net-like plane shape is provided in an inner portion of the substrate, and the impurity region is led-out at a part to the major surface of the substrate. A trench is formed in the substrate from the major surface into the impurity region so that a wall section of the trench is constituted by the impurity region. An dielectric film of the capacitor is formed on the wall section, and a capacitor electrode is formed on the dielectric film and connected to source or drain region of the transistor.</p>
申请公布号 EP0283964(A2) 申请公布日期 1988.09.28
申请号 EP19880104391 申请日期 1988.03.18
申请人 NEC CORPORATION 发明人 NISHIMOTO, SHOZO;INOUE, YASUKAZU;KOTAKI, HIROSHI
分类号 H01L21/8242;H01L27/108;H01L29/94 主分类号 H01L21/8242
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