发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve current/voltage characteristics by irradiating an opposed conductivity type amorphous silicon hydride film with hydrogen plasma. CONSTITUTION:When the junction of one conductivity type single crystal silicon film 2 and the opposing conductivity type amorphous silicon hydride film 3 is formed and the opposed conductivity type amorphous silicon hydride film 3 is irradiated with hydrogen plasma, hydrogen diffuses in the reverse conductivity type amorphous silicon hydride film 3, hydrogen atoms are taken in to dangling bonds on the interface of amorphous silicon and crystalline silicon, and the dangling bonds disappear. Accordingly, generation-recombination currents are reduced, thus acquiring a hetero-diode having excellent current/ voltage characteristics.
申请公布号 JPS63232415(A) 申请公布日期 1988.09.28
申请号 JP19870066026 申请日期 1987.03.20
申请人 FUJITSU LTD 发明人 FUJIOKA HIROSHI;TAKASAKI KANETAKE
分类号 H01L21/205;H01L31/04 主分类号 H01L21/205
代理机构 代理人
主权项
地址