发明名称 TEST ITEM GENERATING METHOD
摘要 PURPOSE:To easily generate test items corresponding to hardware even in case of the change of hardware by automatically generating test items in accor dance with input information of items of a DA (design automation) output file obtained in the hardware design stage and preliminarily set test exceptional items. CONSTITUTION:A DA output file 5 and test exceptional items 8 are used as input information of a processing circuit 11, and the processing circuit 11 selects addresses of test items which can be scanned in and out from the DA output file 5. Addresses of test exceptional items 8 are eliminated to take out only addresses of items required for test, and test items 14 are determined. That is, addresses of test exceptional items 8 are eliminated from the DA output file obtained in the hardware design stage. Thus, addresses corresponding to the change of hardware based on the DA output file 5 are easily obtained even in case of the change of hardware and test items are generated in a short time even for a large scale processor.
申请公布号 JPS63231638(A) 申请公布日期 1988.09.27
申请号 JP19870066036 申请日期 1987.03.20
申请人 FUJITSU LTD 发明人 ASADA SHIYUUKO
分类号 G06F11/22 主分类号 G06F11/22
代理机构 代理人
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