| 摘要 |
An automatic fixturing system for printed circuit board testing including a magazine for temporarily storing probes, and a test head adapted to receive selected ones of the probes and position the probes in a pattern matching test points on the printed circuit board. The test head is supported adjacent to the magazine so that selected ones of the probes may be transferred. A base member is positioned adjacent the test head on one side thereof in a position to contact the base of each probe, and the printed circuit board is supported adjacent the test head with the head of each probe adapted to contact a test point on the printed circuit board. The test head includes a probe plate and a base plate positioned in parallel and separated by a spacing substantially the same as the probe length. Separate injector rods are provided for transferring individual probes to the test head. During the transfer, the probe plate is moved in its own plane relative to the base plate so that one or more probe plate apertures may at any given time be momentarily aligned with their corresponding pre-assigned base plate apertures and with the corresponding probe locations in the adjacent magazine, along axes perpendicular to the probe and base plates, so as to permit transfer of the corresponding probes in a straight line between the magazine and test head.
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