| 摘要 |
PURPOSE:To reduce the extracting omission of an inferior loop and to improve the testing efficiency by impressing a bias magnetic field whose size is large enough to detect the same number of inferior loops as the maximum allowable number of the inferior loops to an element to be tested and extracting the same or the fewer number of the inferior loops as the maximum allowable number of the inferior loops. CONSTITUTION:The bias magnetic field of which size is large enough to detect the same number of the inferior loops as the maximum allowable number of said loops is impressed to the element to be tested and the same or the fewer number of the inferior loops as the maximum allowable number of said loops is extracted among the detected inferior loops. Therefore, the inferior loops generated when the larger magnetic field than the bias magnetic field is impressed and omitted to be extracted by a former testing method can be extracted in the same way and in the same or little bit longer time as the former testing method. Thus, the extracting omission can be reduced and the testing efficiency can be improved.
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