发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form an electrode wiring with excellent conductivity without discon nection at all by a method wherein two intermediate layers comprising specific material is provided between Al and polysilicon to form a wiring layer. CONSTITUTION:An insulating film 3 such as SiO2 etc., is deposited on an Si substrate 1 whereon an N type diffused region 2 etc., is formed to make a contact hole for coating with the first layer 4 comprising polySi doped impurity by CVD process. This layer 4 is further coated with the second lower Ti layer 5-1 and the upper Tin layer 5-2 by sputtering process to form the third Al layer on these two intermediate layers for completing a wiring layer. Due to the two intermediate layers, i.e., the Ti layer with excellent conductivity and the Tin layer with excellent barrier property, an electrode wiring with excellent conductivity without disconnection at all can be formed. Further, as the two intermediate layers, TiSi of TiN silicide and TiN, the same can be applied.
申请公布号 JPS63229852(A) 申请公布日期 1988.09.26
申请号 JP19870064704 申请日期 1987.03.19
申请人 FUJITSU LTD 发明人 ABE YASUNARI
分类号 H01L29/43;H01L21/28;H01L21/3205;H01L21/768;H01L23/52 主分类号 H01L29/43
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