发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To let an element display its performance up to the limit of its rating by a method wherein a snubber capacitor is installed nearly just above a cooler and a pipe line and its terminal is arranged on the opposite side of a condenser so that the wiring inductance of a snubber circuit can be reduced without obstructing a checking operation or an exchange operation of a semiconductor element such as a GTO or the like. CONSTITUTION:Semiconductor elements 1, 1' are arranged in such a way that their both faces come into contact with coolers 2-2'' containing a coolant; the coolant contained in the coolers 2-2'' is boiled by the heat generated by the semiconductor elements 1, 1; its vapor is guided to a condenser 6 through a pipe line 5 which is arranged nearly horizontally; it is cooled and liquefied. At a semiconductor device constituted in this manner, a snubber capacitor 7 as a snubber circuit component of the semiconductor elements 1, 1' is installed nearly just above the coolers 2-2'' and the pipe line 5; a terminal 8 of the snubber capacitor 7 is arranged on the opposite side of the condenser 6. By this setup, a wiring operation of a snubber circuit can be executed at a shortest distance and the wiring inductance can be reduced sufficiently. On the other hand, the semiconductor elements can be checked and exchanged from the front of the opposite side of the condenser; these operations are not obstructed.
申请公布号 JPS63226953(A) 申请公布日期 1988.09.21
申请号 JP19870058865 申请日期 1987.03.16
申请人 HITACHI LTD;HITACHI TECHNO ENG CO LTD 发明人 ITAHANA HIROSHI;ONOE MASATAKA
分类号 H01L23/427;H01L23/46;H01L25/11 主分类号 H01L23/427
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