| 摘要 |
PURPOSE:To generate a test data at many kinds of intervals with a simple constitution and control, by increasing the number of processing steps other than the test data generating processing at every generation of test data for extending the generated interval of the sequential test data. CONSTITUTION:A test control section 10 controls the entire test operation, and when the test is started, a data is transmitted to a transmission circuit 21S according to the interface control means with the initial set processing of test data or a device to be tested 2 and the data is received at a receiving circuit with the control and a function checking the data supplied from a receiving circuit 21R is provided. The interval transmitting the data from a data transmitting section 12 to the device 2 to be tested is minutely increased at each execution of the step of ''data write'' by the time of one execution of the ''non-operation'' step, and the test data is repetitively transmitted at each interval of [PXt], [(P+1)Xt]-, [nXt] to the device 2 to be tested, where ''P'' is the value initially setting the device 2 to be tested to a counter 13 and ''t'' is the executing time of the non-operation step. |
