| 摘要 |
PURPOSE:To rapidly perform the contact check to a circuit to be tested, by using the comparator function of a pin electronics circuit. CONSTITUTION:When the logical gate circuit of an object UUT to be tested is a receiver element, the leak voltage of the input gate of the element 4 is inputted to a comparator CM and compared with reference voltage Vr to make it possible to judge the connection state of a pin terminal 2. When the logical gate circuit of the object UUT to be tested is a driver element 5, the output level of the element 5 is compared with the reference voltage Vr of the comparator CM to make it possible to judge the connection state of a pin terminal 3. As mentioned above, by putting the comparator CM of a pin electronics circuit 10 to practical use, the contact check of each pin terminal before a test can be performed. Therefore, the measuring relay contact or channel branch circuit connected to a DC characteristic measuring device becomes unnecessary and testing equipment cost is reduced. Further, the required time of contact check is shortened and checking can be rapidly performed.
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