| 摘要 |
PURPOSE:To enhance a sensitivity, by a method wherein the scattering radiation scattered in a specimen is condensed by an asymmetric monochrometer to be received on a wide area and also converted to a fine diffracted beam to be condensed to a radiation detector. CONSTITUTION:This diffraction apparatus is constituted of an X-ray source 10, a diffusion slit 12, a solar slit 14, a light receiving slit 16, an asymmetricall cut monochrometer 20 and a scintillation counter 22. The fanwise support table 32 of a detection part 30 is rotated around a specimen 18 and the scintillation counter support table 36 is rotated around the monochrometer support table 34. Since a monochrometer is used as the asymmetric monochrometer, the scattering X-ray signal scattered in the specimen 18 to pass through a slit 14 is received by a wide area and converted to a fine diffracted beam to be reflected toward the slit 16 and the sensitivity in the counter 22 can be enhanced.
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