发明名称 MAGNETIC MATERIAL TESTER
摘要 PURPOSE:To simply obtain a very near B-H curve at the time of practical use by providing a voltage applying circuit for applying a voltage corresponding to the reset quantity of magnetization, to a coil in which a magnetic material to be tested is a magnetic core. CONSTITUTION:When a voltage of an oscillator 1 is in a positive half period, a diode 7 conducts, and a diode 9 becomes an obstructed state, therefore, to a coil 2, a voltage is applied through the diode 7 and a resistance 8, and a magnetic core 3 being a material to be tested is magnetized gradually, and saturated in the end. When said voltage becomes a negative half period, the diode 7, and the diode 9 become an obstructed state, and a conducting state, respectively, and to the coil 2, a voltage is applied through a variable DC voltage source 10 and the diode 9. This applied voltage becomes variable by changing an output voltage of the voltage source 10 in accordance with the reset quantity of magnetization of the coil. Also, the magnetic flux density B of the magnetic core 3 and the intensity H of the magnetic field are obtained by measuring a voltage and a current of the coil 2 by a voltage measuring circuit 4, and a current measuring circuit 5, respectively, and converting them by a signal processing part 6.
申请公布号 JPS63223583(A) 申请公布日期 1988.09.19
申请号 JP19870056795 申请日期 1987.03.13
申请人 NEC CORP 发明人 SAKAIRI NATSUHIKO
分类号 G01R33/14;G01R33/12 主分类号 G01R33/14
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