发明名称 POSITIVE TYPE RESIST COMPOSITION
摘要 PURPOSE:To improve the resolving power and sensitivity of a compsn. by using specified novolak resin and poly(2-methylpentene-1-sulfone). CONSTITUTION:The titled compsn. consists of alkali-soluble novolak resin represented by the formula and poly(2-methylpentene-1-sulfone). The blending ratio (m/m) between para-t-butylphenol and phenol as starting materials for the novolak resin is regulated to 20/80-40/60. The novolak resin is synthesized by bringing the above-mentioned starting materials and formaldehyde into addition condensation in the presence of an acid catalyst or the like. When the compsn. is used, a positive type resist film for electron beams or X-rays having high resolving power and high sensitivity is obtd.
申请公布号 JPS63217346(A) 申请公布日期 1988.09.09
申请号 JP19870051764 申请日期 1987.03.05
申请人 SUMITOMO CHEM CO LTD;NEC CORP 发明人 HANABATAKE MAKOTO;FURUTA AKIHIRO;KAMIMURA YUKIKAZU;TANIGAKI KATSUMI;KITAKATA MAKOTO
分类号 G03C1/72;G03F7/039 主分类号 G03C1/72
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