发明名称 PROGRAM TEST SYSTEM
摘要 PURPOSE:To improve the program test/debug efficiency as well as the program reliability/productivity by measuring a test coverage only the corrected areas of a program. CONSTITUTION:A memory 11 storing a source program is provided together with a memory 12 storing an executing program, a memory 13 storing the corrected program source information, and a memory 14 storing the coverage information. When a test coverage of a corrected program is measured, the source information of an uncorrected program is compared with that of a corrected program. Then the test coverage data is separated into a part corresponding to a corrected area and a part corresponding to an uncorrected area. The coverage information stored in response to both corrected and uncorrected areas are outputted after replacement and addition. It is possible to obtain a function equivalent to a case where all test coverages are measured again when a program receives a correction. Then the test debug efficiency and the productivity are improved for a program.
申请公布号 JPS63217434(A) 申请公布日期 1988.09.09
申请号 JP19870051024 申请日期 1987.03.05
申请人 HITACHI LTD;HITACHI SOFTWARE ENG CO LTD 发明人 SUZUKI EISUKE;TOKOWAKE SHINICHI;MIYAKE TATSUKI;WATANABE RYOKO
分类号 G06F11/28 主分类号 G06F11/28
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