| 摘要 |
PURPOSE:To eliminate necessity for introducing an expensive algorithmic pattern generator and developing a software at every test pattern by ROM forming a fixed pattern for concentrating a point to go/no go in place of the algorithmic patter generator. CONSTITUTION:A pattern ROM part 2 having a RAM 5 in which a test program is stored and a ROM in which the respective test patterns are written at every type of the respective tests and a driver/receiver part 4 for outputting the test pattern to an object 6 to be tested and receiving a signal outputted from the object to be tested correspondingly to the pattern are provided. Further, a clock generator 3, a comparator 7 for comparing the output signal from the object to be tested with a reference value inputted from the ROM and a main control part 1 are provided. In such a way, the test pattern is stored in the ROM at every type of the respective tests and the corresponding test pattern is read at the time of the test. Thereby, the expensive algorithmic pattern generator is not required nor required the development of the software at every test pattern. |
