发明名称 MESH
摘要 PURPOSE:To facilitate production of a sample for observation as well as simplifying handling of a mesh by providing said mesh to be used as a sample support of a transmission type electron microscope with a holding part having a hole. CONSTITUTION:A mesh 1 to be used as a sample support of a transmission type electron microscope is provided with a holding part 3 having a hole 2. Accordingly, when thinning the sample into film in the state of being placed on the mesh 1 by chemical etching or ion etching, the thinning process can be surely performed by utilizing the hole 2 to stabilize the mesh 1 while avoiding to break the mesh when handling it by using a pincette thus improving safety of handling.
申请公布号 JPS59119663(A) 申请公布日期 1984.07.10
申请号 JP19820228964 申请日期 1982.12.27
申请人 SUWA SEIKOSHA KK 发明人 HAYASHI KENJIROU
分类号 H01J37/20;(IPC1-7):01J37/20 主分类号 H01J37/20
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