| 摘要 |
PURPOSE:To enable selection of trouble detection of two symbols or over contained in an input inspection pattern, by providing an exclusive OR circuit between respective stages of a plurality of feedback shift registers. CONSTITUTION:A circuit 1 to be inspected is a logical circuit and (n) results of inspection are outputted per time slot. A signature circuit 2 receives an input of the number (m) of 2-D systems from the circuit 1 being inspected and more than one feedback shift register (MISR), 4, 5, 6,... generate signatures S0, S1, S2,.... A trouble decision circuit 3 receives inputs of the signatures S0, S1, S2,... and judges that trouble is in the circuit 1 being inspected when all the signatures are zero. When one or more signatures are not zero, the circuit 1 being inspected is determined to cause a trouble. Here, the MISRs 4, 5, 6,... have exclusive OR circuits between respective stages thereof with an inspection pattern and outputs of a plurality of other stages or an output of down stage as inputs and detects errors up to (n) symbols.
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