| 摘要 |
A chip tester for testing microelectronic circuit chips. The tester is capable of testing a variety of chip types in a single socket, including chips having different circuit functions, different pin configurations, and different number of pins. Tests are performed without any preliminary tester setup steps other than placing the chip to be tested into the test socket. The tester applies input voltages and output loads and monitors input and output signals for a first possible chip type, and upon failing to meet expected input/output measurement conditions, applies input voltages and output loads and monitors input and output signals for a second possible chip type. The process is repeated and continues until the monitored inputs/outputs for the chip under test meet the expected input/output measurement conditions, at which time a display device indicates that the chip under test is operational and, preferably, displays the chip type. The tester then repeatedly applies the test procedure only for the chip type being tested, the latter test procedure repeating indefinitely. The inputs and outputs continue to be monitored, and should an error appear in the measurements during any of the repeated tests, a count is made of the number of errors detected, and the count of the number of errors is displayed.
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