| 摘要 |
PURPOSE:To obtain high sensitivity by using a nonlinear optical material with an electrode which detects an overlap part of light as a nonlinear optical material, eliminating the need for phase matching, an obtaining a signal directly as an electric signal. CONSTITUTION:A light beam 1 to be measured is split into two by a beam splitter 2, one is reflected by a mirror 5, and the other is delayed by an optical delay part 3 and then superposed again by a beam mixer 4. This is converged by a lens 6 on the nonlinear material 10 with the electrode. A voltage with depends upon the intensity of the incident light is induced, so this is amplified by an FET preamplifier 7 and a voltage amplifier 8 and its time mean value is calculated by an integrator 9 and inputted to an X-Y recorder 11 as long-axis data. Here, the lateral axis is assigned to an optical delay quantity and a sweep is made to obtain the autocorrelation function of light pulses. Consequently, the need for position matching eliminated and the signal is obtained directly as the electric signal. Thus, the high sensitivity is obtained.
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