| 摘要 |
PURPOSE:To make it unnecessary to transfer test signal data to a test pattern generating device, and to contrive to shorten test time by allowing an MPU to execute a test program being similar to the one by which a circuit element to be tested is offered for practical use, operating the circuit element to be tested, based thereon, and executing a test. CONSTITUTION:Instead of executing a test by supplying a test pattern signal to a circuit element to be tested 8, a micro-processing unit (MPU) 6 which functions as a host computer of the circuit element to be tested 8 is allowed to execute a test program being similar to the one which is executed by the host computer of its circuit element 8, when the circuit element to be tested 8 is offered for practical use. Subsequently, while comparing an output of the circuit element to be tested 8 which operates, based thereon, and an expected value (f) given from an expected value generator 9, the quality of the circuit element to be tested 8 is decided. In such a way, by utilizing a program counter which an MPU 6 has, the time of an ALU in the MPU 6 and a memory access is shortened. |
