发明名称 Reference potential generating circuit for a semiconductor device.
摘要 <p>A plurality of dummy cells forming a dummy cell array is formed in the semiconductor chip (100). A dummy cell (32) surrounded by other dummy cells in the array is used for generating a reference potential. The contact (282) of Vss line for connecting the source of the dummy cell to the ground is located at the center portion of the dummy cell array. With such a layout, the cell pattern of the dummy cell is the same as that of the memory cells. Accordingly, the transistor characteristics of these cells may also be substantially identical to each other. Thus, the problem arising from the difference in the pattern geometry can be solved.</p>
申请公布号 EP0279453(A1) 申请公布日期 1988.08.24
申请号 EP19880102448 申请日期 1988.02.19
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OHTSUKA, NOBUAKI C/O PATENT DIVISION;TANAKA, SUMIO C/O PATENT DIVISION;MIYAMOTO, JUNICHI C/O PATENT DIVISION;ATSUMI, SHIGERU C/O PATENT DIVISION;IMAMIYA, KENITI C/O PATENT DIVISION
分类号 G11C17/00;G11C16/04;H01L27/10;H01L27/115;(IPC1-7):H01L27/10;G11C7/00 主分类号 G11C17/00
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