| 摘要 |
PURPOSE:To speedily and accurately measure time variation of the angle distribution of the intensity of scattered light due to a dynamic process by varying a high voltage applied to a photoelectron multiplier tube which receives the scattered light from a sample cell according to the intensity last scattered light. CONSTITUTION:Homogeneous light from an argon laser 1 passes through polarizers 2a and 2b, a shutter 3, and an optical attenuation plate 7 and is incident on the sample cell 4. Its transmitted luminous flux is incident on the photoelectric surface of the photoelectron multiplier tube 17 through a round hole slit 12, a right-angled prism 11, a light guide prism 13, and an analyzer 15. The anode current of the photoelectron multiplier tube 17 is inputted to a personal computer 23 through a preamplifier 18, a DC amplifier 19, and an AD converter 24 and processed as specified to obtain the intensity of the scattered light. At this time, the high voltage from an operational power source 27 is applied to the photomultiplier tube 17 at this time, but this value is determined according to the last measured scattered light intensity.
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