| 摘要 |
<p>A test system for comparatively analyzing a complex signal indicative of the operational status of an electronic device to be tested includes means (36) for sampling a signal whose characteristics are indicative of the unknown operational status of the electronic device to produce a comparison data base. The comparison data base is processed by a microcomputer (20) to produce comparison transform coefficients. These transform coefficients are compared with a set of reference transform coefficients, representative of a desired operational status of the device, to determine the actual operational status of the device. The sampling means is electrically connected to a conductive element (24) capacitively coupled to the device and permanently mounted in a fixed spatial relationship with the device.</p> |
