发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE:To simplify the self-diagnostic program of an application system and facilitate its generation by enabling the value of a signature register to e set and referred to with a machine instruction. CONSTITUTION:The signature register 11 which is utilized to test an LSI is assigned as one register which can be accessed with a normal machine instruction. When the machine instruction is executed, the stored values of two selected registers of a general register 13 are supplied to a computing element 12 through buses 14 and 15 and their addition result is sent out to a bus 16 and stored in the register 13 again. At the same time, the addition result on the bus 16 is supplied to a register 11 provided successively to the register 13 and the signature of this addition result is calculated. The value is set in the register 1 and referred to as well as the register 13.
申请公布号 JPS63193237(A) 申请公布日期 1988.08.10
申请号 JP19870025724 申请日期 1987.02.06
申请人 TOSHIBA CORP 发明人 TAMARU KIICHIRO;TANAKA KOICHI;KANUMA AKIYOSHI;YAMADA YASUO
分类号 G06F11/22;G06F11/267 主分类号 G06F11/22
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