Conductive EMI test system, a decoupling network therefor

摘要

Development of worst case operating environment, interfering parameters of a test item, is effected by a decoupling device. The device includes a series of resonators configured and interconnected in a particular manner along with a shunt capacitance group. When connected between the test item and its support system, the device provides such an impedance to signals other than those need for normal operation, that the highest noise voltage levels emit from the test item. These levels permit developing repeatable worse cases inteference parameters which provide a guide for modifying the test item circuit components and connectors so as to minimize the affects of generating EMI sources or to immunize susceptible receptors within the test item.