发明名称 INTEGRATED PROCESSING METHOD FOR SECTOR SCANNING FLAW DETECTION DATA
摘要 PURPOSE:To accurately evaluate a defect position in section and continuity and length of a lengthwise defect by integrating flaw detection data in the section in sector scanning units and then integrating lengthwise data. CONSTITUTION:Data in the section are integrated in one-sector scan units while based upon the lower corner position of a material 3 to be inspected. Then lengthwise data integration based upon the data integrated in the section is performed. The data integration in the section is decided from a state where the continuity between steps and a defect detection time are within specific permissible difference ranges. When the position is evaluated, it is calculated from a step where the height of a defect echo peaks and the position relation between a probe and the material to be inspected. In the lengthwise data integration, a continuous defect is decided and a defect end point is updated when the integrated data is in the section continue and the evaluated defect is the position within the specific permissible difference range. Consequently, the defect position, continuity, and length are accurately evaluated.
申请公布号 JPS63191957(A) 申请公布日期 1988.08.09
申请号 JP19870024361 申请日期 1987.02.04
申请人 KOBE STEEL LTD 发明人 YUYA KENJI
分类号 G01N29/44;G01N29/04;G01N29/07;G01N29/11;G01N29/22 主分类号 G01N29/44
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