发明名称 SEMICONDUCTOR PROTECTIVE DEVICE
摘要 PURPOSE:To protect an integrated circuit from operational errors by a method wherein an N-type region connected to a prescribed terminal of an integrated circuit is surrounded by a P-type region and the P-type region is surrounded by an N-type region so that it may be isolated from a P-type substrate. CONSTITUTION:An N-type region 11 is surrounded for isolation by a P-type region composed of a P-type buried region 6 and P-type isolating region 9. The P-type region is surrounded by an N-type region composed of an N-type buried region 5 and N-type epitaxial region 8. That is, a P-type region composed of a P-type substrate 1, P-type buried region 7, and P-type isolating region 10 is electrically isolated from other elements in an integrated circuit. Accordingly, upon application of a negative potential to a terminal 3 under abnormal conditions, an N-P-N transistor wherein the N-type region 11 is the emitter, the P-type region 6 is the base, and an N-type region 5 is the collector, starts functioning. The terminal 3 is clamped at a potential level which is lower by a P-N junction forward threshold voltage than the ground potential, and absorbs excess surges. Under the circumstances, an integrated circuit connected to the terminal 3 is protected and a current is drawn out of a ground terminal only. In this way, the integrated circuit is protected from erroneous operations.
申请公布号 JPS63190374(A) 申请公布日期 1988.08.05
申请号 JP19870023064 申请日期 1987.02.02
申请人 MATSUSHITA ELECTRONICS CORP 发明人 ACHINAMI MASAYOSHI
分类号 H01L27/04;H01L21/822;H01L27/02 主分类号 H01L27/04
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