发明名称 IC MEMORY CHECKING CIRCUIT
摘要 <p>PURPOSE:To attain the check of memory performance as well as the check of readout data by providing a checking time control section in case of checking a data read from an IC memory so as to apply checking operation by using a selection signal inputted to the section. CONSTITUTION:An address outputted from an address command section 1 is inputted to an ICROM 2 and the data derived therefrom is checked by a check section 4 with a data of a data storage section 3. Through the operation above, a timing signal generating section 5, a timing selection section 6 and a timing control section 10 with built in a timing data storage section 7 are provided newly, and a selection signal inputted thereto is inputted to the selection section 6. Then the output derived therefrom is fed to the storage section 7 storing plural timing condition data, one timing data is extracted and its output is fed to the command section 1 and the check section 4. Thus, the checking is attained in case of changing the timing and changing the temperature condition and power voltage condition of the ROM 2.</p>
申请公布号 JPS63188900(A) 申请公布日期 1988.08.04
申请号 JP19870021219 申请日期 1987.01.30
申请人 FUJITSU LTD 发明人 FURUKAWA YUICHI
分类号 G11C17/00;G11C29/00;G11C29/56 主分类号 G11C17/00
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