| 摘要 |
The method comprises the step of scanning each of a predetermined set of anomaly templates across the field of pixels. If a match of any of the tamplates against a subfield of pixels field is obtained then it is identified as an anomaly. The anomalies are subfields of pixels with a first value. Next, the zone of pixels of a second value are tested, around each of the identified anomalies, for thickness uniformity. This provides a set of minutia candidates by elimination of all the anomalies where the surounding zone exhibits a lack of uniform thickness as defined by a predetermined criteria. An analytical zone is then established around each of the minutia candidates.
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