发明名称 MOUNTING APPARATUS FOR BOARD TO BE TESTED
摘要 PURPOSE:To accurately position a probe device to a board to be tested in a stable condition by transmitting and receiving electric signal when the board is brought into electric contact with the prove device. CONSTITUTION:A mounting apparatus 10 for a board 11 to be tested includes upper and lower frames 12 and 14, respectively, whose opposite corners are connected to each other by vertical members 16. A conveyor apparatus provided with a pair of parallel rails 22 and 24 transfers the board 11 to be tested from a position outside the frames to a test position between the upper and lower frames 12 and 14, respectively. When the members 16 are rotated, the frame 12 descends and an upper probe plate also descends to a position above the board 11 to be tested. When the members 16 are further rotated, a probe device on the upper probe plate presses the board 11 while moving proves through desired angles so as to secure good contact between the prove device and the board 11 to be tested. When the board 11 to be tested and the probe device are brought into electric contact with each other, the upper probe plate transmits or receives electric signal from a prescribed position on the board 11 to be probe device or vice versa.
申请公布号 JPS63184076(A) 申请公布日期 1988.07.29
申请号 JP19870253489 申请日期 1987.10.07
申请人 YOKOGAWA HEWLETT PACKARD LTD 发明人 RONARUDO KEI KERUSUCHINAA;JIEEMUSU EMU HAISU;MIKAERU ERU BAROTSUKU
分类号 G01R31/02;G01R1/04;G01R31/00;G01R31/28 主分类号 G01R31/02
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