GERAET ZUM AUTOMATISCHEN PRUEFEN VON ELEKTRONISCHEN SCHALTUNGEN UND ZUM DURCHFUEHREN VON ZEITMESSUNGEN

摘要

Apparatus for automatically testing electronic circuits (16) and performing time measurements includes a time measuring circuit (18) for counting clock pulses between stop and start event edges; two independent input selectors (54, 56) for each selectively connecting one of a plurality of its inputs to the time measuring circuit; and a plurality of local comparators (26, 28) located near sources of signals to be timed for generating an event edge upon receiving a signal crossing a programmable threshold. Also disclosed are making time measurements of signals at digital and analog pins using local comparators (68, 70) connected to input selectors over deskewed transmission paths and connecting a local comparator to the filter output of an analog instrument (62, 63); and a differential input selector (Fig. 2 not shown) for selectively connecting one of a plurality of differential inputs (118) to a differential output (122).