| 摘要 |
PURPOSE:To surely recognize patterns by performing the second scan of a bit pattern after line thinning process to detect a bit array that disturbs the following pattern recognizing process and correcting the bit array. CONSTITUTION:The line thinning data is checked again in a TV scan (raster scan) mode of a (3X3)-mask M1 before the bit pattern data undergone a necessary line thinning process for the pattern recognizing process of the next stage is compressed by the linear approximation. When an inter-bit connection (a lump of picture elements) that disturbs the following pattern recognizing process is detected through said scan, this lump is eliminated for conversion into a bit pattern free from faults. Thus it is always possible even for a binarized pattern (bit pattern) obtained after a line thinning process carried out by the Deutsch algorithm to track the lines thereafter. |
