发明名称 MANUFACTURE OF BURIED SEMICONDUCTOR LASER
摘要 PURPOSE:To improve reproducibility on manufacturing and to upgrade element performance, by performing crystal growth of semiconductor multilayered films inclusive of a quantum well active layer and using heat treatment to perform internal diffusion of impurities ranging from a high concentration impurity addition layer to the quantum well active layer. CONSTITUTION:A first conductivity clad layer 2 and a high concentration impurity addition layer 3 are formed on a semiconductor substrate 1 and a fixed width of groove is formed to reach the first clad layer 2, and next semiconductor multilayered films 5, 6, and 7 inclusive of a quantum well active layer 5 are formed thereon. Thereafter heat treatment is used to perform impurity diffusion ranging from the high concentration impurity addition region 3 to the active layer 5. The high concentration impurity addition region 3 is not required to be in contact with the active layer and only required to be disposed at a distance where a necessary impurity concentration is available by heat treatment, and this distance may be determined in consideration of controllability for heat treatment.
申请公布号 JPS63182883(A) 申请公布日期 1988.07.28
申请号 JP19870014197 申请日期 1987.01.26
申请人 TOSHIBA CORP 发明人 FURUYAMA HIDETO;KUROBE ATSUSHI
分类号 H01S5/00 主分类号 H01S5/00
代理机构 代理人
主权项
地址