发明名称 SOLID-STATE IMAGE SENSOR
摘要 PURPOSE:To make the title sensor have a sensitivity to light of long wavelengths, by a method wherein a photo diode, a switching element for reading out the output of the photo diode and a scanning circuit are formed on the main surface of a second conductivity type epitaxial layer. CONSTITUTION:A P-type epitaxial layer 102 is formed on an N-type Si substrate 101. An N-type impurity is partially implanted in the vicinity of the surface of the epitaxial layer 102 and source and drain regions 103 and 104 are formed. An oxide film 105, a gate electrode 106, a lead-out electrode 107, an interlayer insulating film 108 and a passivation film 109 are respectively formed on the epitaxial layer 102. Thereby, a sensitivity to light of long wavelengths is given.
申请公布号 JPS63182854(A) 申请公布日期 1988.07.28
申请号 JP19870015421 申请日期 1987.01.26
申请人 SEIKO EPSON CORP 发明人 NATORI AKIO
分类号 H01L27/146;H04N5/335;H04N5/359;H04N5/369;H04N5/374 主分类号 H01L27/146
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