| 摘要 |
The invention provides a mass spectrometer adapted for the elemental analysis of a sample in which ions are formed from the sample in an inductively coupled plasma (ICP). The flame of the plasma (14) is directed against the front surface (30) of a cone (19), and ions are sampled from the plasma through a hole (16) in the apex of the cone. In order to reduce the intensity of the background mass spectra, the rear surface (32) of the inside of the cone is polished to a surface finish of 5 microns or better, at least in the vicinity of the hole.
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