发明名称 In line testing device for a circuit calculating the discrete Fourier transform and a circuit comprising such a device
摘要 An in line testing device for a circuit calculating discrete Fourier transform as well as a circuit including such a device. The device has a processor for calculating the discrete Fourier transform and a processor effecting in line checking of the calculation of the discrete Fourier transform. The check uses Parseval's theorem: <IMAGE> (1)
申请公布号 US4760549(A) 申请公布日期 1988.07.26
申请号 US19850791130 申请日期 1985.10.24
申请人 THOMSON-CSF 发明人 DU CHENE, ARNAUD;DELALANDE, BRIGITTE;MARIAUX, THIERRY
分类号 G06F17/14;(IPC1-7):G06F7/34;G06F11/00 主分类号 G06F17/14
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