发明名称 SYSTEM FOR LITHOGRAPHY
摘要 <p>PURPOSE:To enhance the effective sensitivity of a photosensitive material by installing a fluorescent-substance retaining structure which is arranged between a means to generate an illuminating beam and a mask structure for lithography and which includes a fluorescent substance and a fluorescent-substance retaining thin film. CONSTITUTION:A fluorescent-substance retaining thin film 2 composed of polyethylene terephthalate is pasted to a ring-shaped retaining substrate 1; a fluorescent substance (e.g., BaSi2O5+Pb) 3 is evaporated onto the film. By this process, a fluorescent-substance retaining structure 3a is formed. The fluorescent- substance retaining structure 3a is attached to an X-ray source window 4, composed of beryllium, which is situated between an X-ray source 4a and a mask structure 10a. After a wafer 12 has been coated with a resist 11, the assembly is pre-baked. While a proximity gap between a mask-retaining thin film 9 and the resist 11 is kept at about 10 mum, the assembly is exposed. By this setup, it is possible to enhance the effective photosensitivity of the resist 11.</p>
申请公布号 JPS63181426(A) 申请公布日期 1988.07.26
申请号 JP19870014383 申请日期 1987.01.23
申请人 CANON INC 发明人 IZAWA YOSHIE;KATO HIDEO
分类号 G03F1/00;G03F1/22;G03F7/20;H01L21/027 主分类号 G03F1/00
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