发明名称 TESTING OF REFRIGERATOR
摘要 A circuit for indicating fault states comprises; a chamber state indicator section (5) including LEDS (D2-5) for alarming abnormal state, a door state alarm LED (D3), a normal state indication lamp (NORMAL), and a buzzer (BZ); an amplifying section (3) including a transistor (TR1), buffers (2,2'), a microprocessor (1), amplifiers (A1-4), sensors (F, DF, R) for detecting each chamber state; and a comparator section (4) including amplifiers (A5-8), condensers (C2-4) , and a diode (D7). When a certain part is abnormal, a diagnosis code showing a fault place blinks a lamp and when the part checked is normal, the checking for abnormality passes to the next stage in sequence.
申请公布号 KR880001304(B1) 申请公布日期 1988.07.22
申请号 KR19850003572 申请日期 1985.05.24
申请人 SAMSUNG ELECTRONICS CO.,LTD. 发明人 LIM, HYUN-MOON
分类号 G01M99/00;(IPC1-7):G01M19/00 主分类号 G01M99/00
代理机构 代理人
主权项
地址