发明名称 CHECKING APPARATUS OF IC
摘要 PURPOSE:To prevent the breakdown or the like of IC to be checked, by providing a limit value memory, a readout circuit, a comparator circuit, etc. CONSTITUTION:When a checking set value is loaded on a register 14, for instance, an address information specifying the register 14 and the checking set value are delivered from a central processing unit CPU 10 to a system bus 18. Meanwhile, a readout circuit 22 converts said address information into a corresponding address information in a limit value memory 20 and gives the same to the memory 20, while reading out from the memory 20 a limit value corresponding to the register 14. Then, a comparison between the limit value read out from the memory 20 and the checking set value on the bus 18 is conducted in a comparator circuit 24. In the case when the checking set value exceeds the limit value, an error signal ERR is delivered from the circuit 24 and given as an interrupt signal to CPU 10. Stopping the execution of a test program, CPU 10 conducts an interrupt processing and makes an alarm circuit 26 operate to inform an operator of an error. In this way, the breakdown or the like of IC to be checked can be prevented.
申请公布号 JPS63177079(A) 申请公布日期 1988.07.21
申请号 JP19870009399 申请日期 1987.01.19
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 WADA EIJI;HINO ETSUO
分类号 H01L21/66;G01R31/28 主分类号 H01L21/66
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