MESSANORDNUNG UND MESSVERFAHREN ZUR HOCHAUFLOESENDEN BRECHZAHLPROFILMESSUNG AN GLASFASERN

摘要

A measurement system and process are disclosed for determining any refraction coefficient profile of single or multiple wave beam waveguides. Contrary to such known apparatuses, a laser semiconductor diode (43) is used as light source. The end surface of the fibers is continuously scanned, whereby direct current motors, piezo-translators or optical deflection systems are used instead of the usual stepping engine adjustement units. Exact axial mounting of the fiber (5) to be measured is ensured by using a commercially available fiber plug. The local resolution is improved by deploying the detected intensity gradient with the amplified scanned intensity distribution of the beam size of the light spot on the end surface of the fiber. The measurement system can be developed into a universal measurement apparatus for any kind of fiber by pulsing the laser diode.