发明名称 IC TESTER
摘要 PURPOSE:To facilitate the engagement and disengagement of a performance board by a small force by a method wherein the turning force of an operating lever is converted into the forward-backward movement force of a forward- backward moving member by a linking member and this forward-backward movement of the forward-backward moving member is converted into a pressing force or a detaching force for the performance board by a slanting cam groove. CONSTITUTION:The turning operation force of an operating lever 12 is converted into the forward-backward movement force of a forward-backward moving member by a linking member and this forward-backward movement of the forward-backward moving member is converted into a pressing force or a detaching force for a performance board 4 by a slanting cam groove 6a. This method enables the attainment of the pressing force or the detaching force being larger than the operation force of the lever 12. Accordingly, even in an IC tester for a multiple unit simultaneous test which requires a large force for inserting or pulling connectors of the board 4 in to or from a measuring circuit board 2 since the number of the connectors and the number of poles thereof are large, the engagement and disengagement of the board 4 can be performed easily by a small operation force.
申请公布号 JPS63177080(A) 申请公布日期 1988.07.21
申请号 JP19870009402 申请日期 1987.01.19
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 TSUYUKI SHOJI;MATSUMOTO SHINICHI
分类号 H01L21/66;G01R31/28 主分类号 H01L21/66
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