| 摘要 |
A DA converter testing system for testing DA converters which convert digital information into analog information, particularly suitable for testing the dynamic characteristics of such DA converters. The DA converter testing system has an AD conversion means which receives the analog output signal of a test DA converter, operating at a conversion period greater than the waveform repetition period of the repetitive output waveform of the test DA converter. Accordingly, the fast repetitive output waveform of the test DA converter can be converted into corresponding digital codes at a high accuracy and hence the DA converter testing system is more suitable than the conventional DA converter testing system, for testing the dynamic characteristics of DA converters.
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