| 摘要 |
PURPOSE:To enable the checking of functions and operations of a test auxiliary circuit individually, by inputting information of an address decoder and an input data register into an output data register to enable observation through an external terminal. CONSTITUTION:When checking functions of a test supplementing circuit, a data system from external terminals 7 and 8 is stored into an address decoder 4 and an input data register 5. Then, a latch clock is applied to a latch clock external terminal 21 to transmit address information to a memory circuit 3 and to store data of the register 5 and address information of the decoder 4 into an input data information storage section 16 and an address decoder information storage section 15. At the same time, data of a designated circuit of the memory circuit 3 is also stored into an output register 6. Then, when a clock is applied from a data shift clock external terminal 22, data of the register 6 and the information storage sections 15 and 16 appear sequentially at an external terminal 9 for outputting data. This enables the checking of functions and operations of the test auxiliary circuit.
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