ULTRALJUDSSOND FOR PROVNING AV ETT SLITSAT ELLER HALFORSETT MATERIALSTYCKE

摘要

An ultrasonic probe 1 for non-destructive material testing of slotted or hollowed pieces of material 2 and comprising a carrier 3 and a probe part 4 connected to said carrier, which probe part is formed with one or several piezo-electric crystals 5 provided at or adjacent the tip thereof and mounted at an angle to the longitudinal plane of the probe of between 45 DEG and 50 DEG and rotated around its own axis over an angle of about 45 DEG -47 DEG . The probe can be formed with two or several symmetrically arranged piezo-electric crystals for allowing a complete testing of the piece of material by one single docking operation in that the different crystals are connected in turn after each other. Further the probe may also be formed with one or several straight scanning piezo-electric crystals 6 mounted in the carrier 3.