| 摘要 |
PURPOSE:To easily obtain an output with which a semiconductor logic circuit can be inspected by providing a reference level signal generating circuit which can uses >=4 reference level signals having different levels at the same time. CONSTITUTION:For example, N=4 reference level signal generating circuits E1-E4 are provided and plural, i.e. four reference signals V1-V4 which have mutually different levels at the same time are used. Further, inspecting circuits D1-D4 are provided. A semiconductor logic circuit B is therefore a semiconductor inverter circuit and when a signal generating circuit 1 for inspection generates a signal S1 for inspection which varies from a high-level VIH state to a low level VIL state, a reference level signal having the same level is only generated. Consequently, reference level signals which have different levels need not generated in a section where the signal S1 for inspection is at the high level VIH and a section where the signal is at the low level VIH. |
