发明名称 RESISTANCE VALUE MEASURING METHOD FOR CHIP RESISTOR
摘要 <p>PURPOSE:To perform the four-terminal measurement of the resistance value of a chip resistor continuously at a high speed by bringing the lower part surfaces of both electrode parts of the chip resistor into contact with two couples of conductive thin plates from above. CONSTITUTION:The two couples of conductive thin plates 3a and 3b, and 3a' and 3b' with elasticity which are held on support bases 4a and 4b, and 4a' and 4b' opposite each other across a slight gap are fixed on a gable roof at slight intervals. The lower part surfaces of both end electrode parts 2a and 2b of the chip resistor 1 are made to contact the two couples of conductive thin plates 3a and 3b, and 3a' and 3b' to measure the resistance value of the resistor 1. Consequently, the four-terminal measurement of the resistance value of the resistor 1 is performed continuously at a high speed.</p>
申请公布号 JPS63172969(A) 申请公布日期 1988.07.16
申请号 JP19870004322 申请日期 1987.01.12
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NAKAJIMA JUNICHI;ARAI TOSHIO;NAKADA AKIO
分类号 G01R1/06;G01R27/00;H01C17/00 主分类号 G01R1/06
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