发明名称 THICKNESS MEASURING INSTRUMENT FOR METALLIC FOIL
摘要 PURPOSE:To accurately measure the thickness of metallic foil by arithmetic operation by bringing a couple of probe rods into contact with the metallic foil to be measured lengthwise and supplying a constant current, and measuring the potential difference generated between said two points with the constant current. CONSTITUTION:The metallic foil 1 to be measured is mounted and fixed on a supporting base 5 and the probe rods 7 and 8 brought into contact with two lengthwise points A and B on the metallic foil 1. Then a constant current source 6 is connected to the probe rods 7 and 8 to supply the constant current between the two points A and B said metallic foil 1. The the potential difference generated between said two points A and B with the constant current is measured by a potentiometer 9, whose measured value is inputted to an arithmetic means 10. A thickness arithmetic means 10 calculates the thickness of the object metallic film 1 according to the input potential difference.
申请公布号 JPS63172902(A) 申请公布日期 1988.07.16
申请号 JP19870005474 申请日期 1987.01.13
申请人 YOKOGAWA ELECTRIC CORP 发明人 NISHIDA KENJIRO
分类号 G01B7/06 主分类号 G01B7/06
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